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Surface & Materials Modification

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Surface & Materials Modification

Surface & Materials ModificationOliverToon2017-02-14T09:15:03+01:00

Surface & Materials Modification – Related STAIB Instruments Products

Neutralization

Low energy electron sources

Evaporation

High energy small focus electron sources

Annealing

Electron flood sources
High energy small focus electron sources
High beam power electron sources

Desorption

Electron flood sources
High energy small focus electron sources
Low energy electron sources
General purpose- & High beam power electron sources

Dissociation

Electron flood sources
High energy small focus electron sources
Low energy electron sources
General purpose- & High beam power electron sources

Sputtering

Ion sources

Ionization of Gases

High energy small focus electron sources
Low energy electron sources
General purpose- & High b eam power electron sources

Applications

In situ Characterization
Surface Analysis Techniques
Material Growth Monitoring
Electron Diffraction
Scanning Electron Microscopy
Photoelectron Microscopy (PEEM)
Depth Profiling
Space Environment Simulation
Surface & Materials Modification

Products

RHEED
AUGER / XPS / EELS / REELS
Electron Sources
Ion Sources
X-ray Source
Energy Analyzers & Imaging Energy Filters
Charged Particle Detectors
PEEM & IEEM
UHV-Systems for Surface Analysis
Packages for Surface Analysis
Data Acquisition & Instrument Control Software

Applications

In situ Characterization
Surface Analysis Techniques
Material Growth Monitoring
Electron Diffraction
Scanning Electron Microscopy
Photoelectron Microscopy (PEEM)
Depth Profiling
Space Environment Simulation
Surface & Materials Modification

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