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Scanning Electron Microscopy

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Scanning Electron Microscopy

Scanning Electron MicroscopyOliverToon2017-02-14T11:35:13+01:00

Scanning Electron Microscopy – Related STAIB Instruments Products

SEM (Scanning Electron Microscopy)

Microfocus and nanofocus electron sources
Scanning package for SEM
Secondary electron detectors (SED)

SAM (Scanning Auger Microscopy)

Microfocus and nanofocus electron sources
Scanning package for SAM
Energy analyzer ESA 100 / ESA 150
Energy analyzer DESA 100 / DESA 150

Absorbent Current EM (Electron Microscope)

Microfocus and nanofocus electron sources
Scanning package
Secondary electron detectors (SED)

Elastically Scattered EM (Electron Microscope)

Microfocus and nanofocus electron sources
Scanning package
Secondary electron detectors (SED)

EBSD (Electron Backscattered Diffraction)

EBSD energy filter
Nanofocus electron source

Applications

In situ Characterization
Surface Analysis Techniques
Material Growth Monitoring
Electron Diffraction
Scanning Electron Microscopy
Photoelectron Microscopy (PEEM)
Depth Profiling
Space Environment Simulation
Surface & Materials Modification

Products

RHEED
AUGER / XPS / EELS / REELS
Electron Sources
Ion Sources
X-ray Source
Energy Analyzers & Imaging Energy Filters
Charged Particle Detectors
PEEM & IEEM
UHV-Systems for Surface Analysis
Packages for Surface Analysis
Data Acquisition & Instrument Control Software

Applications

In situ Characterization
Surface Analysis Techniques
Material Growth Monitoring
Electron Diffraction
Scanning Electron Microscopy
Photoelectron Microscopy (PEEM)
Depth Profiling
Space Environment Simulation
Surface & Materials Modification

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