STAIB Instruments components and systems can be used in a wide field of applications. Choose your application area from the overview below, and see which of our instruments can assist you in your reasearch.
In situ Characterization
RHEED, RHEED for high pressure application (TorrRHEED™), In situ real time AUGER, RHEELS, TRAX, Micro RHEED
Surface Analysis Techniques
AES, XPS, UPS, ISS, EELS / REELS, Secondary electron emission (SEY, SED, Backscattered EY), Charge compensation, IPES, Sample cleaning, Sample preparation, Sample current measurements, Sample imaging, Cathodoluminescence, SEM, SAM
Material Growth Monitoring
MBE, Oxide MBE, PLD, Laser MBE, IBAD, Sputter deposition, ALD, MOCVD, Combinatorial approaches
Space Environment Simulation
Materials aging, Electron and proton beam treatment, Charging experiments, Detector testing
Surface and Materials Modification
Neutralization, Evaporation, Annealing, Desorption, Dissociation, Sputtering, Ionization of gases